DocumentCode :
2140229
Title :
Counting Bugs is Harder Than You Think
Author :
Black, Paul E.
Author_Institution :
Software & Syst. Div., U.S. Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fYear :
2011
fDate :
25-26 Sept. 2011
Firstpage :
1
Lastpage :
9
Abstract :
Software Assurance Metrics and Tool Evaluation (SAMATE) is a broad, inclusive project at the U.S. National Institute of Standards and Technology (NIST) with the goal of improving software assurance by developing materials, specifications, and methods to test tools and techniques and measure their effectiveness. We review some SAMATE sub-projects: web application security scanners, malware research protocol, electronic voting systems, the SAMATE Reference Dataset, a public repository of thousands of example programs with known weaknesses, and the Static Analysis Tool Exposition (SATE). Along the way we list over two dozen possible research questions, which are also collaboration opportunities. Software metrics are incomplete without metrics of what is variously called bugs, flaws, or faults. We detail numerous critical research problems related to such metrics. For instance, is a warning from a source code scanner a real bug, a false positive, or something else? If a numeric overflow leads to buffer overflow, which leads to command injection, what is the error? How many bugs are there if two sources call two sinks: 1, 2, or 4? Where is a missing feature? We conclude with a list of concepts which may be a useful basis of bug metrics.
Keywords :
program debugging; safety-critical software; software metrics; SAMATE project; SAMATE reference dataset; US National Institute of Standards and Technology; Unites States; Web application security scanner; buffer overflow; electronic voting system; malware research protocol; numeric overflow; software assurance metrics and tool evaluation; software metrics; source code scanner; Communities; Java; Malware; Measurement; NIST; Software; software debugging; software engineering; software metrics; software tools;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Source Code Analysis and Manipulation (SCAM), 2011 11th IEEE International Working Conference on
Conference_Location :
Williamsburg, VI
Print_ISBN :
978-1-4577-0932-6
Type :
conf
DOI :
10.1109/SCAM.2011.24
Filename :
6065191
Link To Document :
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