• DocumentCode
    2140363
  • Title

    2D regression channel estimation for equalizing OFDM signals

  • Author

    Chang, Ming X. ; Su, Yu.T.

  • Author_Institution
    Dept. of Commun. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    240
  • Abstract
    We present a channel estimation method for orthogonal frequency division multiplexing (OFDM) signals. Our method is based on a two-dimensional nonlinear regression method, taking into account the correlations of the fading process in both time and frequency domains. We derive a general bit error rate (BER) expression which can also used to predict the performance of many other OFDM channel estimates. The performance of this new estimate is very close to the theoretical bit error probability lower bound that is obtained by assuming that the channel response is perfectly known. Unlike linear minimum mean-squared-error (LMMSE) channel estimates, it does not need to know or estimate the channel statistics like the channel correlation matrix and SNR hence is insensitive to additive white Gaussian noise (AWGN)
  • Keywords
    AWGN; OFDM modulation; correlation methods; equalisers; error statistics; fading channels; least squares approximations; parameter estimation; 2D regression channel estimation; AWGN; LMMSE channel estimates; OFDM signals equalization; SNR; additive white Gaussian noise; bit error probability lower bound; bit error rate; channel correlation matrix; channel response; channel statistics; correlation; fading process; frequency domain; general BER expression; least squares method; linear minimum mean-squared-error; orthogonal frequency division multiplexing; performance; time domain; two-dimensional nonlinear regression method; AWGN; Additive white noise; Bit error rate; Channel estimation; Error probability; Fading; Frequency domain analysis; OFDM; Signal to noise ratio; Statistics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vehicular Technology Conference Proceedings, 2000. VTC 2000-Spring Tokyo. 2000 IEEE 51st
  • Conference_Location
    Tokyo
  • ISSN
    1090-3038
  • Print_ISBN
    0-7803-5718-3
  • Type

    conf

  • DOI
    10.1109/VETECS.2000.851454
  • Filename
    851454