DocumentCode :
2140509
Title :
Performance assessment on board-level drop reliability for chip scale packages (fine-pitch BGA)
Author :
Chong, Desmond Y R ; Che, F.X. ; Xu, L.H. ; Toh, H.J. ; Pang, John H L ; Xiong, B.S. ; Lim, B.K.
Author_Institution :
United Test & Assembly Center Ltd., Singapore
fYear :
0
fDate :
0-0 0
Abstract :
Board level drop testing is an effective method to characterize the solder joint reliability performance of miniature handheld products. In this study, drop test of printed circuit boards (PCB) with four-screw support condition was conducted for a 15 mm times 15 mm fine-pitch ball grid array (FBGA) package assembly with solder ball compositions of 36Pb-62Sn-2Ag and Sn-4Ag-0.5Cu on PCB surface finishes of organic solderability preservative, electroless nickel immersion gold and immersion tin. The results revealed a strong influence of different intermetallic compound formation on soldered assemblies drop durability. The lead-based solder supersedes the lead-free composition regardless of the types of surface finish. Joints on organic solderability preservative were found to be strongest for each solder type. Other factors affecting drop reliability such as component location on the board and thermal aging effects are reported
Keywords :
ball grid arrays; chip scale packaging; fine-pitch technology; gold alloys; lead alloys; printed circuit testing; reliability; silver alloys; solders; tin alloys; PCB testing; PbSnAg; SnAgCu; board level drop testing; board-level drop reliability; chip scale packages; fine-pitch BGA; immersion gold; immersion tin; intermetallic compound formation; miniature handheld products; printed circuit boards testing; solder joint reliability; thermal aging; Assembly; Chip scale packaging; Circuit testing; Electronics packaging; Environmentally friendly manufacturing techniques; Lead; Nickel; Printed circuits; Soldering; Surface finishing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2006. Proceedings. 56th
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
1-4244-0152-6
Type :
conf
DOI :
10.1109/ECTC.2006.1645671
Filename :
1645671
Link To Document :
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