Title :
High temperature photonic crystal fiber tip sensor
Author :
Park, Bryan ; Provine, J. ; Howe, Roger T. ; Solgaard, Olav ; Jung, Il Woong
Author_Institution :
Sch. of Electr. Eng., Stanford Univ., Stanford, CA, USA
Abstract :
We demonstrate a temperature sensor consisting of a 2-dimensional, Silicon (Si), Photonic Crystal (PC) attached to the facet of a standard single-mode optical fiber. The 2-D PC sensors are fabricated on standard Si wafers, using a single mask and a combination of isotropic and anisotropic etching, and micro-assembled onto the facets of the optical fibers by Si welding. The temperature of the Si-PC sensor is monitored by measuring its reflectance spectrum in the 1250 nm to 1650 nm wavelength range. The measured reflectivity peak shifts from 100°C to 700°C is 0.1036 nm/°C. The observed spectral shift and temperature sensitivity are significantly higher than other high temperature fiber Bragg grating sensors, and comparable to long-period fiber gratings sensors. The high sensitivity along with the compactness and robustness gives these sensors the strong potential for use in harsh environments.
Keywords :
elemental semiconductors; etching; fibre optic sensors; holey fibres; photonic crystals; reflectivity; silicon; spectral line shift; temperature sensors; 2D PC sensors; Si; anisotropic etching; high temperature photonic crystal fiber tip sensor; isotropic etching; reflectance spectrum; spectral shift; temperature sensitivity; temperature sensor; wavelength 1250 nm to 1650 nm; welding;
Conference_Titel :
Sensors, 2010 IEEE
Conference_Location :
Kona, HI
Print_ISBN :
978-1-4244-8170-5
Electronic_ISBN :
1930-0395
DOI :
10.1109/ICSENS.2010.5690911