DocumentCode
2141121
Title
Novel LDMOS Structure for 2 GHz High Power Basestation Application
Author
Jos, H.F.F.
Author_Institution
Philips Semiconductors DSC-N, Gerstweg 2, 6534 AE Nijmegen. The Netherlands. Rik.Jos@nym.sc.philips.com
Volume
1
fYear
1998
fDate
Oct. 1998
Firstpage
739
Lastpage
744
Abstract
An LDMOS is described for high power (>70W) 2 GHz basestation application that includes several novel structures. High power gain is achieved by minimizing gate resistance and feedback capacitance. The gate resistance is reduced by using metallized submicron polysilicon gates and the feedback capacitance is lowered by a metal shielding between drain and gate. The source is directly connected to ground thus avoiding common lead inductance and optimizing power gain. In power MOS devices differential mode oscillations can hamper uspcaling of the device to higher output powers. In our LDMOS we prevent this by using a novel, very compact lay-out that we call ´MONOMOS´, since it merely consist of one integral active area. This is made possible by using very long gate fingers that still have low gate resistance because of metallization of the polysilicon. The LDMOS shows high gain (12 dB) at high output powers (70W) at 2 GHz and low intermodulation distortion, which makes it an excellent device for CDMA basestations. Both gain and distortion are substantially better than those of bipolar transistors.
Keywords
Capacitance; Feedback; Fingers; Gain; Inductance; Intermodulation distortion; MOS devices; Metallization; Multiaccess communication; Power generation;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 1998. 28th European
Conference_Location
Amsterdam, Netherlands
Type
conf
DOI
10.1109/EUMA.1998.338079
Filename
4139166
Link To Document