• DocumentCode
    2141121
  • Title

    Novel LDMOS Structure for 2 GHz High Power Basestation Application

  • Author

    Jos, H.F.F.

  • Author_Institution
    Philips Semiconductors DSC-N, Gerstweg 2, 6534 AE Nijmegen. The Netherlands. Rik.Jos@nym.sc.philips.com
  • Volume
    1
  • fYear
    1998
  • fDate
    Oct. 1998
  • Firstpage
    739
  • Lastpage
    744
  • Abstract
    An LDMOS is described for high power (>70W) 2 GHz basestation application that includes several novel structures. High power gain is achieved by minimizing gate resistance and feedback capacitance. The gate resistance is reduced by using metallized submicron polysilicon gates and the feedback capacitance is lowered by a metal shielding between drain and gate. The source is directly connected to ground thus avoiding common lead inductance and optimizing power gain. In power MOS devices differential mode oscillations can hamper uspcaling of the device to higher output powers. In our LDMOS we prevent this by using a novel, very compact lay-out that we call ´MONOMOS´, since it merely consist of one integral active area. This is made possible by using very long gate fingers that still have low gate resistance because of metallization of the polysilicon. The LDMOS shows high gain (12 dB) at high output powers (70W) at 2 GHz and low intermodulation distortion, which makes it an excellent device for CDMA basestations. Both gain and distortion are substantially better than those of bipolar transistors.
  • Keywords
    Capacitance; Feedback; Fingers; Gain; Inductance; Intermodulation distortion; MOS devices; Metallization; Multiaccess communication; Power generation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 1998. 28th European
  • Conference_Location
    Amsterdam, Netherlands
  • Type

    conf

  • DOI
    10.1109/EUMA.1998.338079
  • Filename
    4139166