DocumentCode :
2141133
Title :
Fault scanner for reconfigurable logic
Author :
Shnidman, Nathan R. ; Mangione-Smith, William H. ; Potkonjak, Miodrag
Author_Institution :
Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
fYear :
1997
fDate :
15-16 Sep 1997
Firstpage :
238
Lastpage :
255
Abstract :
We propose a technique for online built-in self-test of Field Programmable Gate Arrays (FPGAs). The goal of this system is to detect deviations from the intended functionality of an FPGA without using special-purpose hardware, hardware external to the device, and without interrupting system operation. A system that solves these problems would be useful for mission-critical applications with resource constraints. We present here a fault detection system which solves these problems through an online fault scanning methodology. Resources internal to the device are configured to test for faults. Testing scans across an FPGA, checking a section at a time. The viability and effectiveness of such a system is supported through simulation of the system on a model FPGA
Keywords :
automatic testing; built-in self test; fault location; field programmable gate arrays; integrated circuit testing; logic testing; FPGA testing; built-in self-test; fault detection system; fault scanner; mission-critical applications; online BIST; online fault scanning methodology; reconfigurable logic; resource constraints; Computer science; Fault detection; Field programmable gate arrays; Hardware; Impedance; Monitoring; Performance evaluation; Programmable logic arrays; Reconfigurable logic; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Research in VLSI, 1997. Proceedings., Seventeenth Conference on
Conference_Location :
Ann Arbor, MI
Print_ISBN :
0-8186-7913-1
Type :
conf
DOI :
10.1109/ARVLSI.1997.634857
Filename :
634857
Link To Document :
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