DocumentCode :
2141134
Title :
Thin-slot formalism for the FDTD analysis of thin-slot penetration considering ground reflection
Author :
Run, Xiong ; Bin, Chen ; Qin, Yin ; Xiaoshuan, Yang ; Bihua, Zhou
Author_Institution :
Lab. of Electromagn., Nanjing Eng. Inst., Nanjing, China
fYear :
2009
fDate :
16-20 Sept. 2009
Firstpage :
341
Lastpage :
344
Abstract :
In this paper, a new rectangular enclosure model for shielding effectiveness (SE) is established, which is in more accordant with practical engineering environment for it considered the ground reflection. The SE is analyzed by using different thin-slot formalism methods and the results given by C-TSF, ETSF and CP are compared with results of the finer resolution. When the width of the slot is comparable with the space increment, both ETSF and CP formalism are feasible, However, ETSF accords with finer resolution results more exactly. When the slot is far narrower than space increment, C-TSF is in good agreement with finer resolution. From the conclusion we can get a fast and accurate way of determining the SE through aperture of various sizes.
Keywords :
electromagnetic shielding; finite difference time-domain analysis; FDTD analysis; contour pass integral; ground reflection; rectangular enclosure model; shielding effectiveness; thin slot formalism; thin slot penetration; EMP radiation effects; Finite difference methods; Laboratories; Matrix decomposition; Maxwell equations; Polynomials; Reflection; Sparse matrices; Time domain analysis; Transmission line matrix methods; C-TSF; CP; ETSF; FDTD; shielding enclosure; thin-slot;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Environmental Electromagnetics, 2009. CEEM 2009. 5th Asia-Pacific Conference on
Conference_Location :
Xian
Print_ISBN :
978-1-4244-4344-4
Type :
conf
DOI :
10.1109/CEEM.2009.5303565
Filename :
5303565
Link To Document :
بازگشت