• DocumentCode
    2141265
  • Title

    An embedded device technology based on a molded reconfigured wafer

  • Author

    Brunnbauer, M. ; Fürgut, E. ; Beer, G. ; Meyer, T. ; Hedler, H. ; Belonio, J. ; Nomura, E. ; Kiuchi, K. ; Kobayashi, K.

  • Author_Institution
    Infineon Technol. AG, Regensburg
  • fYear
    0
  • fDate
    0-0 0
  • Abstract
    We report an innovative embedded device wafer level packaging technology based on a "molded reconfigured 200 mm wafer". Silicon dice are tested, grinded, and diced. For the set-up of the "reconfigured wafer" these bare silicon dice are placed faces down onto a carrier system. The core process of this technology is the encapsulation of silicon dice. We demonstrate that compression molding is a promising approach with respect to robust processing, topology, adhesion, and reliability properties. The "molded reconfigured wafer" is the base to apply thin-film interconnects similar to back-end of line processes
  • Keywords
    compression moulding; encapsulation; integrated circuit packaging; silicon; 200 mm; Si; adhesion properties; compression molding; embedded device technology; molded reconfigured wafer; reliability properties; silicon dice encapsulation; thin-film interconnects; topology properties; wafer level packaging technology; Assembly; Chemical technology; Costs; Electronic packaging thermal management; Laminates; Semiconductor device packaging; Silicon; Space technology; Testing; Wafer scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2006. Proceedings. 56th
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    1-4244-0152-6
  • Type

    conf

  • DOI
    10.1109/ECTC.2006.1645702
  • Filename
    1645702