• DocumentCode
    2141458
  • Title

    Internal field distribution measurements of PCB insulation layers

  • Author

    Fukunaga, K. ; Maeno, T. ; Okamoto, K.

  • Author_Institution
    National Inst. of Inf. & Commun. Technol., Tokyo
  • fYear
    0
  • fDate
    0-0 0
  • Abstract
    Dielectric properties inside the insulation layer has become important in the case of multi-layer and embedded printed circuit boards. We observed internal charge and electric field profiles of insulation layers and found that the internal electric field profile formed by the applied electric field and ion impurities depends on the internal configuration of composites
  • Keywords
    dielectric properties; electric field measurement; impurities; insulation; printed circuit testing; PCB insulation layers; dielectric properties; embedded printed circuit boards; internal electric field profile; internal field distribution measurements; ion impurities; multilayer printed circuit boards; Acoustic pulses; Aging; Dielectric losses; Dielectric measurements; Dielectrics and electrical insulation; Monitoring; Printed circuits; Pulsed electroacoustic methods; Space charge; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2006. Proceedings. 56th
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    1-4244-0152-6
  • Type

    conf

  • DOI
    10.1109/ECTC.2006.1645709
  • Filename
    1645709
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2141458