Title :
Silicon nanowire CMOSFETs : Fabrication, characteristics, and memory application
Author_Institution :
Memory Div., Samsung Electron. Co., Hwasung, South Korea
Abstract :
Continuous device scaling has led to the development of various transistors such as Ultra-Thin-Body SOI MOSFET, FinFET, and gate all around (GAA) MOSFETs . As the device shrinks further, the ultimate MOSFET structure would be GAA nanowire MOSFET with a fully depleted channel thoroughly controlled by the gate electrode. In this paper, fabrication processes of silicon nanowire MOSFETs on bulk Si using top-down method, their characteristics including 1D and quantum dot characteristics will be reported. Also applicable examples to memory devices such as SRAM and NAND Flash will be demonstrated.
Keywords :
CMOS integrated circuits; MOSFET; elemental semiconductors; nanoelectronics; nanowires; semiconductor quantum dots; semiconductor storage; silicon; 1D characteristics; CMOSFET; FinFET; NAND flash; SRAM; Si; memory devices; quantum dot; silicon nanowire MOSFET; top-down method; ultrathin-body SOI MOSFET; CMOSFETs; Electrodes; Fabrication; FinFETs; MOSFET circuits; Nanoscale devices; Quantum dots; Random access memory; Silicon; Transistors;
Conference_Titel :
Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-2185-5
Electronic_ISBN :
978-1-4244-2186-2
DOI :
10.1109/ICSICT.2008.4734467