DocumentCode :
2141920
Title :
Runtime verification of nonlinear analog circuits using incremental Time-augmented RRT algorithm
Author :
Ahmadyan, Seyed Nematollah ; Kumar, Jayanand Asok ; Vasudevan, Shobha
Author_Institution :
Coordinated Science Lab, Electrical and Computer Engineerning Department, University of Illinois at Urbana-Champaign, USA
fYear :
2013
fDate :
18-22 March 2013
Firstpage :
21
Lastpage :
26
Abstract :
Because of complexity of analog circuits, their verification presents many challenges. We propose a runtime verification algorithm to verify design properties of nonlinear analog circuits. Our algorithm is based on performing exploratory simulations in the state-time space using the Time-augmented Rapidly Exploring Random Tree (TRRT) algorithm. The proposed runtime verification methodology consists of i) incremental construction of the TRRT to explore the state-time space and ii) use of an incremental online monitoring algorithm to check whether or not the incremented TRRT satisfies or violates specification properties at each iteration. In comparison to the Monte Carlo simulations, for providing the same state-space coverage, we utilize a logarithmic order of memory and time.
Keywords :
Algorithm design and analysis; Analog circuits; Integrated circuit modeling; Monitoring; Monte Carlo methods; Phase locked loops; Runtime;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
Conference_Location :
Grenoble, France
ISSN :
1530-1591
Print_ISBN :
978-1-4673-5071-6
Type :
conf
DOI :
10.7873/DATE.2013.019
Filename :
6513465
Link To Document :
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