• DocumentCode
    2141938
  • Title

    Vanadium oxide thermal microprobes for nanocalorimetry

  • Author

    De Bruyker, Dirk ; Recht, Michael I. ; Torres, Frank E. ; Bell, Alan G. ; Bruce, Richard H.

  • Author_Institution
    Palo Alto Res. Center (PARC), Palo Alto, CA, USA
  • fYear
    2010
  • fDate
    1-4 Nov. 2010
  • Firstpage
    2358
  • Lastpage
    2362
  • Abstract
    Highly sensitive thermal microprobes are presented, consisting of curved cantilevers with vanadium oxide thermistors located at their tips. The cantilevers are realized by stress-engineered metal thin films and the thermistors consist of reactively sputter-deposited vanadium pentoxide. The thermistors are electrically contacted through the stressed metal layer, and at the same time thermally insulated from the substrate due to the relatively small thickness and large length of the cantilevers. We propose to apply these novel thermal microprobes in a nanocalorimetry system, in order to lower the cost and increase the sensitivity of the measurements.
  • Keywords
    calorimetry; cantilevers; metallic thin films; vanadium compounds; VO2; curved cantilevers; high sensitive thermal microprobes; nanocalorimetry system; reactive sputter-deposited vanadium pentoxide; stress-engineered metal thin films; thermistors; vanadium oxide thermal microprobes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2010 IEEE
  • Conference_Location
    Kona, HI
  • ISSN
    1930-0395
  • Print_ISBN
    978-1-4244-8170-5
  • Electronic_ISBN
    1930-0395
  • Type

    conf

  • DOI
    10.1109/ICSENS.2010.5690948
  • Filename
    5690948