Title :
High performance CMOS surrounding gate transistor (SGT) for ultra high density LSIs
Author :
Takato, H. ; Sunouchi, K. ; Okabe, N. ; Nitayama, A. ; Hieda, K. ; Horiguchi, F. ; Masuoka, F.
Author_Institution :
Toshiba Corp., Kawasaki, Japan
Abstract :
A novel transistor with compact structure has been developed for MOS devices. This transistor, whose gate electrode surrounds the pillar silicon island, reduces the occupied area for all kinds of circuits. For example, the occupied area of a CMOS inverter can be shrunk to 50% of that using planar transistors. The other advantages are steep cutoff characteristics, very small substrate bias effects, and high reliability. These features are due to the unique structure, which results in greater gate controllability and in electric field relaxation at the drain edge.<>
Keywords :
CMOS integrated circuits; VLSI; integrated circuit technology; reliability; semiconductor technology; CMOS inverter; CMOS surrounding gate transistor; Si pillar channel; ULSI; compact structure; drain edge; electric field relaxation; features; greater gate controllability; high reliability; nonplanar structure; small substrate bias effects; steep cutoff characteristics; ultra high density LSIs; vertical channel CMOS; Circuits; Degradation; Electrodes; Impurities; Inverters; Large scale integration; Silicon; Threshold voltage; Transistors; Very large scale integration;
Conference_Titel :
Electron Devices Meeting, 1988. IEDM '88. Technical Digest., International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/IEDM.1988.32796