Title :
Joint sequential decoding and noncoherent multiuser detection for synchronous signaling over a flat fading channel
Author :
Hadinejad-Mahram, Hafez ; Schotten, Hans D.
Author_Institution :
Inst. fur Elektrische Nachrichtentech., Aachen Univ. of Technol., Aachen, Germany
Abstract :
This paper considers the problem of joint multiuser detection and decoding of data transmitted over a frequency nonselective Rayleigh fading channel, where the detection is performed without previous knowledge of the channel coefficients. Both detection and decoding are carried out jointly by means of a sequential decoder. We derive a metric matched to the above problem which is based on the well-known Fano (1963) metric and discuss its properties. Using computer simulation, we evaluate the performance of a sequential decoder that uses this metric in conjunction with the stack algorithm. Our simulation results show that the proposed algorithm outperforms a receiver that uses optimum multiuser detection and optimum soft decision decoding as two separate steps, however at the cost of even larger time complexity
Keywords :
Rayleigh channels; code division multiple access; data communication; digital simulation; maximum likelihood decoding; maximum likelihood detection; multiuser channels; sequential decoding; spread spectrum communication; telecommunication signalling; DS-CDMA; Fano metric; computer simulation; data transmission; flat fading channel; joint multiuser detection; joint sequential decoding; maximum likelihood path; mobile radio; noncoherent multiuser detection; nonselective Rayleigh fading channel; optimum multiuser detection; optimum soft decision decoding; performance evaluation; sequential decoder; simulation results; stack algorithm; synchronous signaling; time complexity; Computer simulation; Convolutional codes; Decoding; Detectors; Fading; Frequency; Multiuser detection; Signal detection; Signal to noise ratio; Viterbi algorithm;
Conference_Titel :
Vehicular Technology Conference Proceedings, 2000. VTC 2000-Spring Tokyo. 2000 IEEE 51st
Conference_Location :
Tokyo
Print_ISBN :
0-7803-5718-3
DOI :
10.1109/VETECS.2000.851528