DocumentCode
2142268
Title
Combining RAM technologies for hard-error recovery in L1 data caches working at very-low power modes
Author
Lorente, Vicente ; Valero, Alejandro ; Sahuquillo, Julio ; Petit, Salvador ; Canal, Ramon ; Lopez, Pedro ; Duato, Jose
Author_Institution
Department of Computer Engineering, Universitat Politècnica de València, Spain
fYear
2013
fDate
18-22 March 2013
Firstpage
83
Lastpage
88
Abstract
Low-power modes in modern microprocessors rely on low frequencies and low voltages to reduce the energy budget. Nevertheless, manufacturing induced parameter variations can make SRAM cells unreliable producing hard errors at supply voltages below Vccmin.
Keywords
Arrays; Capacitance; Capacitors; Program processors; Proposals; SRAM cells;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
Conference_Location
Grenoble, France
ISSN
1530-1591
Print_ISBN
978-1-4673-5071-6
Type
conf
DOI
10.7873/DATE.2013.031
Filename
6513477
Link To Document