Title :
High-speed simulation of PCB emission and immunity with frequency-domain IC/LSI source models
Author :
Wada, Osami ; Fukumoto, Yukihiro ; Osaka, Hideki ; Wang, Zhi Liang ; Shibata, Osamu ; Matsunaga, Shigeki ; Watanabe, Tetsushi ; Takahashi, Eiji ; Koga, Ryuji
Author_Institution :
Graduate Sch. of Natural Sci. & Technol., Okayama Univ., Japan
Abstract :
Some recent results from research conducted in the EMC group at Okayama University are reviewed. A scheme for power-bus modeling with an analytical method is introduced. A linear macro-model for ICs/LSIs, called the LECCS model, has been developed for EMI and EMS simulation. This model has a very simple structure and is sufficiently accurate. Combining the LECCS model with analytical simulation techniques for power-bus resonance simulation provides a method for high-speed EMI simulation and decoupling evaluation related to PCB and LSI design. A useful explanation of the common-mode excitation mechanism, which utilizes the imbalance factor of a transmission line, is also presented. Some of the results were investigated by implementing prototypes of a high-speed EMI simulator, HISES.
Keywords :
circuit simulation; electromagnetic compatibility; electromagnetic interference; large scale integration; printed circuit design; EMI simulation; EMS simulation; HISES; LECCS model; LSI source model; PCB emission; PCB immunity; common-mode excitation mechanism; decoupling evaluation; electromagnetic interference; frequency-domain IC source model; imbalance factor; power-bus modeling; power-bus resonance simulation; printed circuit board; transmission line; Analytical models; Electromagnetic compatibility; Electromagnetic interference; Frequency domain analysis; High speed integrated circuits; Immunity testing; Integrated circuit modeling; Large scale integration; Medical services; Resonance;
Conference_Titel :
Electromagnetic Compatibility, 2003 IEEE International Symposium on
Print_ISBN :
0-7803-7835-0
DOI :
10.1109/ISEMC.2003.1236554