Title :
Power current modeling of IC/LSI with load dependency for EMI simulation
Author :
Osaka, Hideki ; Wada, Osami ; Kinoshita, Tomohiro ; Toyota, Yoshitaka ; Tanaka, Daisuke ; Koga, Ryuji
Author_Institution :
Syst. Dev. Lab., Hitachi Ltd., Yokohama, Japan
Abstract :
In this paper, we describe how we modeled EMI noise from the power-pin current of an LSI that has two ports: a power-ground port and a driver output port. We named this modeling the "Linear Equivalent Circuit and Current Source for I/O (LECCS-I/O)" model and with it measured power current and power-ground impedance for various combinations of loading capacitances and decoupling inductances using a small scale IC (74LVC04). Results showed that up to 500 MHz, the LECCS-I/O model could predict peak and valley frequencies of the power current where the error was within 2.5 MHz, and where the peak current error was less than 5 dB. The application range of the LECCS-I/O model is valid where the non-overlap duration of the dumping oscillation wave between cycles is longer than twice the time constant of the waveform.
Keywords :
electromagnetic interference; equivalent circuits; integrated circuit modelling; large scale integration; 2.5 MHz; EMI noise; EMI simulation; IC; LECCS-I/O model; LSI; decoupling inductances; driver output port; dumping oscillation wave; electromagnetic interference; linear equivalent circuit and current source for I/O; load dependency; loading capacitances; peak frequency; power current modeling; power-ground impedance; power-ground port; power-pin current; valley frequency; Capacitance measurement; Circuit simulation; Current measurement; Driver circuits; Electromagnetic interference; Equivalent circuits; Impedance measurement; Integrated circuit modeling; Integrated circuit noise; Large scale integration;
Conference_Titel :
Electromagnetic Compatibility, 2003 IEEE International Symposium on
Print_ISBN :
0-7803-7835-0
DOI :
10.1109/ISEMC.2003.1236556