Title :
Proceedings of 18th Annual Electrical Overstress/Electrostatic Discharge Symposium
Abstract :
The following topics were dealt with: MR heads; device, testing and failure analysis; factory and training issues; system effects of ESD; ESD materials and testing; on-chip protection and simulation; ESD considerations in industry
Keywords :
electrostatic discharge; ESD materials; MR heads; device testing; electrical overstress; electrostatic discharge; factory; failure analysis; industry; on-chip protection; simulation; training;
Conference_Titel :
Designing Low Power Digital Systems, Emerging Technologies (1996)
Conference_Location :
No information available
Print_ISBN :
0-7803-3328-4
DOI :
10.1109/ETLPDS.1996.508879
