• DocumentCode
    2142529
  • Title

    Towards a Formal Framework for Product Line Test Development

  • Author

    Kang, Sungwon ; Lee, Jihyun ; Kim, Myungchul ; Lee, Woojin

  • Author_Institution
    Inf. & Commun. Univ., Daejeon
  • fYear
    2007
  • fDate
    16-19 Oct. 2007
  • Firstpage
    921
  • Lastpage
    926
  • Abstract
    Product line test development is more complicated than the conventional test development for a single application. There were numerous research works in the past that address various issues and aspects that arise in product line testing and test development. However, we still lack a coherent framework that can guide product line test development and link various product line development concepts to relevant product line testing concepts. In this paper we provide a basis for a formal framework for product line test development by linking product line development concepts such as feature, variability, product line architecture, component and use case scenario to product line test concepts such as test architecture, variability for test and test scenario and by providing a systematic way for deriving product line tests, adapting product line tests to a specific product and deriving product specific tests.
  • Keywords
    program testing; software architecture; software engineering; product line development; product line test development; software development; Application software; Architecture description languages; Automatic testing; Costs; Information technology; Joining processes; Product development; Programming; Software testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer and Information Technology, 2007. CIT 2007. 7th IEEE International Conference on
  • Conference_Location
    Aizu-Wakamatsu, Fukushima
  • Print_ISBN
    978-0-7695-2983-7
  • Type

    conf

  • DOI
    10.1109/CIT.2007.40
  • Filename
    4385203