DocumentCode
2142529
Title
Towards a Formal Framework for Product Line Test Development
Author
Kang, Sungwon ; Lee, Jihyun ; Kim, Myungchul ; Lee, Woojin
Author_Institution
Inf. & Commun. Univ., Daejeon
fYear
2007
fDate
16-19 Oct. 2007
Firstpage
921
Lastpage
926
Abstract
Product line test development is more complicated than the conventional test development for a single application. There were numerous research works in the past that address various issues and aspects that arise in product line testing and test development. However, we still lack a coherent framework that can guide product line test development and link various product line development concepts to relevant product line testing concepts. In this paper we provide a basis for a formal framework for product line test development by linking product line development concepts such as feature, variability, product line architecture, component and use case scenario to product line test concepts such as test architecture, variability for test and test scenario and by providing a systematic way for deriving product line tests, adapting product line tests to a specific product and deriving product specific tests.
Keywords
program testing; software architecture; software engineering; product line development; product line test development; software development; Application software; Architecture description languages; Automatic testing; Costs; Information technology; Joining processes; Product development; Programming; Software testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer and Information Technology, 2007. CIT 2007. 7th IEEE International Conference on
Conference_Location
Aizu-Wakamatsu, Fukushima
Print_ISBN
978-0-7695-2983-7
Type
conf
DOI
10.1109/CIT.2007.40
Filename
4385203
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