Title :
Reliability challenges of real-time systems in forthcoming technology nodes
Author :
Hamdioui, Said ; Gizopoulos, Dimitris ; Guido, Groeseneken ; Nicolaidis, Michael ; Grasset, Arnaud ; Bonnot, Philippe
Author_Institution :
Computer Engineering, Delft University of Technology, the Netherlands
Abstract :
Forthcoming technology nodes are posing major challenges on the manufacturing of reliable (real-time) systems: process variations, accelerated degradation aging, as well as external and internal noise are key examples. This paper focuses on real-time systems reliability and analyzes the state-of-the-art and the emerging reliability bottlenecks from three different perspectives: technology, circuit/IP and full system.
Keywords :
Circuit faults; Clocks; Delays; Integrated circuit reliability; Logic gates; Reliability engineering; Circuit reliability; dependable computing; embedded real-time systems;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
Conference_Location :
Grenoble, France
Print_ISBN :
978-1-4673-5071-6
DOI :
10.7873/DATE.2013.040
