• DocumentCode
    2142555
  • Title

    Reliability challenges of real-time systems in forthcoming technology nodes

  • Author

    Hamdioui, Said ; Gizopoulos, Dimitris ; Guido, Groeseneken ; Nicolaidis, Michael ; Grasset, Arnaud ; Bonnot, Philippe

  • Author_Institution
    Computer Engineering, Delft University of Technology, the Netherlands
  • fYear
    2013
  • fDate
    18-22 March 2013
  • Firstpage
    129
  • Lastpage
    134
  • Abstract
    Forthcoming technology nodes are posing major challenges on the manufacturing of reliable (real-time) systems: process variations, accelerated degradation aging, as well as external and internal noise are key examples. This paper focuses on real-time systems reliability and analyzes the state-of-the-art and the emerging reliability bottlenecks from three different perspectives: technology, circuit/IP and full system.
  • Keywords
    Circuit faults; Clocks; Delays; Integrated circuit reliability; Logic gates; Reliability engineering; Circuit reliability; dependable computing; embedded real-time systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
  • Conference_Location
    Grenoble, France
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4673-5071-6
  • Type

    conf

  • DOI
    10.7873/DATE.2013.040
  • Filename
    6513486
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2142555