• DocumentCode
    2142659
  • Title

    The influence of the source/drain-tie length in a novel self-aligned S/D tie SOI for improving self-heating

  • Author

    Jyi-Tsong Lin ; Kang, Shiang-Shi ; Eng, Yi-Chuen ; Tseng, Yi-Ming ; Tasi, Ying-Chieh ; Tseng, Hung-Jen ; Jheng, Bao-Tang ; Lin, Po-Hsieh

  • Author_Institution
    Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, China
  • fYear
    2008
  • fDate
    20-23 Oct. 2008
  • Firstpage
    219
  • Lastpage
    222
  • Abstract
    A self-aligned novel S/D tie SOI device is presented for the first time in the field of silicon on insulator technology. The new device having thick-body and body-passway is demonstrated to improve the self-heating effect and decrease the parasitic source/drain resistance. When the source/drain-tie length is too small or too big, the negative differential conductance behavior can be observed. It can be achieved that the lattice temperature of the new device is reduced 32% when compared with the two conventional SOI devices.
  • Keywords
    MOSFET; silicon-on-insulator; SOI MOSFET; lattice temperature; negative differential conductance; parasitic source-drain resistance; self-aligned S/D tie SOI; self-heating effect; silicon-on-insulator; source-drain-tie length; Delay; Immune system; Lattices; Silicon on insulator technology; Substrates; Sun; Temperature; Thermal conductivity; Threshold voltage; Wet etching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-2185-5
  • Electronic_ISBN
    978-1-4244-2186-2
  • Type

    conf

  • DOI
    10.1109/ICSICT.2008.4734511
  • Filename
    4734511