Title :
An overview of emerging international measurement standards in electromagnetic compatibility for integrated circuits
Author :
Carlton, Ross M.
Author_Institution :
Motorola SPS, Austin, TX, USA
Abstract :
The characterization of the electromagnetic compatibility (EMC) performance of integrated circuits (ICs) is receiving increasing focus as new applications and technology trends combine to raise the complexity of EMC compliance. The increased focus is driving the need for standardized measurement procedures to enable comparison of different devices. This paper describes the work in process by IEC TC47/SC47A Working Group 9 to standardize emissions and immunity EMC test methods for integrated circuits. The two standards currently in development for RF radiated and conducted emissions, as well as their status, are discussed.
Keywords :
IEC standards; electromagnetic compatibility; integrated circuits; measurement standards; EMC compliance; EMC test methods; IEC TC47/SC47A Working Group 9; RF radiated emissions; conducted emissions; device comparison; electromagnetic compatibility; integrated circuit; integrated circuits; international measurement standards; standardized measurement procedures; Application specific integrated circuits; Circuit testing; Electromagnetic compatibility; Electromagnetic measurements; IEC standards; Immunity testing; Integrated circuit measurements; Integrated circuit technology; Integrated circuit testing; Measurement standards;
Conference_Titel :
Electromagnetic Compatibility, 2003 IEEE International Symposium on
Print_ISBN :
0-7803-7835-0
DOI :
10.1109/ISEMC.2003.1236573
