• DocumentCode
    2142930
  • Title

    Impact on EMI profile due to monitor stand high frequency resonance effects

  • Author

    Thomason, Gary ; Ivanov, V. ; Worley, Richard

  • Author_Institution
    Dell Comput. Corp., Round Rock, TX, USA
  • Volume
    1
  • fYear
    2003
  • fDate
    18-22 Aug. 2003
  • Firstpage
    124
  • Abstract
    Dell has developed a new method for analyzing the shielding effectiveness and high frequency resonance of different mechanical structures. This method utilizes the Spherical Radiating Standard (SRS) dipole antenna as a stable source, which is placed directly inside the mechanical structure (e.g., computer chassis or monitor stand). By utilizing such a method, quantifiable and repeatable emission measurements can be made when analyzing these different mechanical structures. The purpose of this study was to; 1) analyze the high frequency resonance effect of a monitor stand (MS) utilizing the SRS antenna: and 2) correlate these results with an actual real life setup (portable computer and port replicator inserted into MS).
  • Keywords
    electromagnetic interference; electromagnetic shielding; resonance; standards; Dell; EMI profile; SRS antenna; computer chassis; dipole antenna; electromagnetic inference; emission measurements; high frequency resonance effect; high frequency resonance effects; mechanical structure; mechanical structures; monitor stand; port replicator; portable computer; radio frequency; shielding effectiveness; spherical radiating standard; Cables; Computer peripherals; Computerized monitoring; Electromagnetic compatibility; Electromagnetic interference; Magnetic resonance; Mechanical variables measurement; Portable computers; Radio frequency; Resonant frequency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2003 IEEE International Symposium on
  • Print_ISBN
    0-7803-7835-0
  • Type

    conf

  • DOI
    10.1109/ISEMC.2003.1236576
  • Filename
    1236576