DocumentCode :
2142930
Title :
Impact on EMI profile due to monitor stand high frequency resonance effects
Author :
Thomason, Gary ; Ivanov, V. ; Worley, Richard
Author_Institution :
Dell Comput. Corp., Round Rock, TX, USA
Volume :
1
fYear :
2003
fDate :
18-22 Aug. 2003
Firstpage :
124
Abstract :
Dell has developed a new method for analyzing the shielding effectiveness and high frequency resonance of different mechanical structures. This method utilizes the Spherical Radiating Standard (SRS) dipole antenna as a stable source, which is placed directly inside the mechanical structure (e.g., computer chassis or monitor stand). By utilizing such a method, quantifiable and repeatable emission measurements can be made when analyzing these different mechanical structures. The purpose of this study was to; 1) analyze the high frequency resonance effect of a monitor stand (MS) utilizing the SRS antenna: and 2) correlate these results with an actual real life setup (portable computer and port replicator inserted into MS).
Keywords :
electromagnetic interference; electromagnetic shielding; resonance; standards; Dell; EMI profile; SRS antenna; computer chassis; dipole antenna; electromagnetic inference; emission measurements; high frequency resonance effect; high frequency resonance effects; mechanical structure; mechanical structures; monitor stand; port replicator; portable computer; radio frequency; shielding effectiveness; spherical radiating standard; Cables; Computer peripherals; Computerized monitoring; Electromagnetic compatibility; Electromagnetic interference; Magnetic resonance; Mechanical variables measurement; Portable computers; Radio frequency; Resonant frequency;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2003 IEEE International Symposium on
Print_ISBN :
0-7803-7835-0
Type :
conf
DOI :
10.1109/ISEMC.2003.1236576
Filename :
1236576
Link To Document :
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