• DocumentCode
    2142945
  • Title

    Compact modeling of multiple-gate MOSFETs

  • Author

    Taur, Yuan ; Song, Jooyoung ; Yu, Bo

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of California - San Diego, San Diego, CA, USA
  • fYear
    2008
  • fDate
    20-23 Oct. 2008
  • Firstpage
    258
  • Lastpage
    261
  • Abstract
    This paper reviews recent development on compact modeling of multiple-gate MOSFETs. First, a core model based on the analytic potential solutions for the highly symmetric double-gate (DG) and surrounding-gate (SG) MOSFETs has been presented. With the addition of quantum, short-channel effects, and capacitance formulations, the core model for DG MOSFETs has been expanded into a full-blown compact model which has subsequently been calibrated and validated by FinFET hardware. For application to other types of experimental multiple-gate MOSFETs developed, the DG and SG MOSFET models have been generalized to other less symmetric structures, including quadruple-gate, triple-gate, ¿-gate, and ¿-gate devices.
  • Keywords
    MOSFET; semiconductor device models; FinFET hardware; double-gate MOSFET; multiple-gate MOSFET; surrounding-gate MOSFET; Calibration; Differential equations; FinFETs; Hardware; Intrusion detection; MOSFETs; Poisson equations; Quantum capacitance; Semiconductor films; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-2185-5
  • Electronic_ISBN
    978-1-4244-2186-2
  • Type

    conf

  • DOI
    10.1109/ICSICT.2008.4734521
  • Filename
    4734521