Title :
Adhesion of metal/polymer bonds using PBT, PC, PS and copper
Author :
Paproth, A. ; Wolter, K.-J. ; Deltschew, R.
Author_Institution :
Electron. Packaging Lab., Technische Univ. Dresden
Abstract :
The extension of the functional features of electronic devices leads to the growing application of new materials especially compound materials. Polymers stand for an innovative potential due to their favorable properties for packaging. The MID technology represents a new growing potential in packaging (Forschungsvereinigung and Feldmann, 2004) and Weiss 2005). Metal/polymer bonds are the basis of this technology. The adhesive strength is a critical factor for the quality and reliability of these bonds. For the adhesion improvement the plasma treatment of the polymer surface wins a key position (Friedrich et al., 2002). Polybutylene terephthalate (PBT), polystyrene (PS) and polycarbonate (PC) were chosen as substrate materials in this work. The metallization of these polymers was realized after oxygen plasma treatment and by thermal evaporation in a high vacuum. The polymer surface composition was analyzed by X-ray photoelectron spectroscopy (XPS). A modified cross hatch tape test was used to determine the adhesion strength of the copper coating as function of different plasma treatment times. Results show that a different amount of polar groups on the polymer surface are the reason for the high copper adhesion
Keywords :
X-ray photoelectron spectra; adhesive bonding; copper; electronics packaging; organic compounds; reliability; MID technology; X-ray photoelectron spectroscopy; adhesion; copper coating; electronic devices; metal/polymer bonds; oxygen plasma treatment; polybutylene terephthalate; polycarbonate; polymer metallization; polymer surface composition; polystyrene; substrate materials; thermal evaporation; Adhesive strength; Copper; Electronics packaging; Metallization; Plasma applications; Plasma materials processing; Plasma properties; Plasma x-ray sources; Polymers; Surface treatment;
Conference_Titel :
Electronic Components and Technology Conference, 2006. Proceedings. 56th
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-0152-6
DOI :
10.1109/ECTC.2006.1645770