• DocumentCode
    2143116
  • Title

    SCC thermal model identification via advanced bias-compensated least-squares

  • Author

    Diversi, Roberto ; Bartolini, Andrea ; Tilli, Andrea ; Beneventi, Francesco ; Benini, Luca

  • Author_Institution
    DEI, University of Bologna, Viale del Risorgimento 2, 40136, Italy
  • fYear
    2013
  • fDate
    18-22 March 2013
  • Firstpage
    230
  • Lastpage
    235
  • Abstract
    Compact thermal models and modeling strategies are today a cornerstone for advanced power management to counteract the emerging thermal crisis for many-core systems-on-chip. System identification techniques allow to extract models directly from the target device thermal response. Unfortunately, standard Least Squares techniques cannot effectively cope with both model approximation and measurement noise typical of real systems. In this work, we present a novel distributed identification strategy capable of coping with real-life temperature sensor noise and effectively extracting a set of low-order predictive thermal models for the tiles of Intel´s Single-chip-Cloud-Computer (SCC) many-core prototype.
  • Keywords
    Autoregressive processes; Noise; Noise measurement; Temperature measurement; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
  • Conference_Location
    Grenoble, France
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4673-5071-6
  • Type

    conf

  • DOI
    10.7873/DATE.2013.060
  • Filename
    6513506