DocumentCode
2143116
Title
SCC thermal model identification via advanced bias-compensated least-squares
Author
Diversi, Roberto ; Bartolini, Andrea ; Tilli, Andrea ; Beneventi, Francesco ; Benini, Luca
Author_Institution
DEI, University of Bologna, Viale del Risorgimento 2, 40136, Italy
fYear
2013
fDate
18-22 March 2013
Firstpage
230
Lastpage
235
Abstract
Compact thermal models and modeling strategies are today a cornerstone for advanced power management to counteract the emerging thermal crisis for many-core systems-on-chip. System identification techniques allow to extract models directly from the target device thermal response. Unfortunately, standard Least Squares techniques cannot effectively cope with both model approximation and measurement noise typical of real systems. In this work, we present a novel distributed identification strategy capable of coping with real-life temperature sensor noise and effectively extracting a set of low-order predictive thermal models for the tiles of Intel´s Single-chip-Cloud-Computer (SCC) many-core prototype.
Keywords
Autoregressive processes; Noise; Noise measurement; Temperature measurement; Temperature sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
Conference_Location
Grenoble, France
ISSN
1530-1591
Print_ISBN
978-1-4673-5071-6
Type
conf
DOI
10.7873/DATE.2013.060
Filename
6513506
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