Title :
System and circuit level power modeling of energy-efficient 3D-stacked wide I/O DRAMs
Author :
Chandrasekar, Karthik ; Weis, Christian ; Akesson, Benny ; Wehn, Norbert ; Goossens, Kees
Author_Institution :
Computer Engineering, TU Delft, The Netherlands
Abstract :
JEDEC recently introduced its new standard for 3D-stacked Wide I/O DRAM memories, which defines their architecture, design, features and timing behavior. With improved performance/power trade-offs over previous generation DRAMs, Wide I/O DRAMs provide an extremely energy-efficient green memory solution required for next-generation embedded and high-performance computing systems. With both industry and academia pushing to evaluate and employ these highly anticipated memories, there is an urgent need for an accurate power model targeting Wide I/O DRAMs that enables their efficient integration and energy management in DRAM stacked SoC architectures. In this paper, we present the first system-level power model of 3D-stacked Wide I/O DRAM memories that is almost as accurate as detailed circuit-level power models of 3D-DRAMs. To verify its accuracy, we experimentally compare its power and energy estimates for different memory workloads and operations against those of a circuit-level 3D-DRAM power model and show less than 2% difference between the two sets of estimates.
Keywords :
Adaptation models; Integrated circuit modeling; Mathematical model; Memory management; Power demand; Random access memory;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
Conference_Location :
Grenoble, France
Print_ISBN :
978-1-4673-5071-6
DOI :
10.7873/DATE.2013.061