DocumentCode :
2143332
Title :
Integrated micro laser Doppler velocimeter with 3-D structure
Author :
Higurashi, Eiji ; Suga, Tadatomo ; Sawada, Renshi
Author_Institution :
Res. Center for Adv. Sci. & Technol., Univ. of Tokyo, Tokyo, Japan
fYear :
2010
fDate :
1-4 Nov. 2010
Firstpage :
2409
Lastpage :
2412
Abstract :
Compact and thin micro laser Doppler velocimetry (LDV) sensor with 3-D structure (2.8 mm × 2.8 mm × 1 mm thick) was developed using Au-Au surface-activated bonding method (bonding temperature: 150°C). It consists of two elements: a glass substrate with bonded photodiode chips, electrodes, and refractive microlenses; and a micromachined Si substrate with a submount, a bonded laser diode chip, micromirrors, and through-silicon vias. The feasibility of measuring velocity was demonstrated for various moving objects such as a reflective grating, an Au wire, and a light diffusing ground glass. The micro LDV sensor detected relative speeds as low as 0.4 μm/s and Doppler beat signal frequency showed good linearity to the relative velocity.
Keywords :
Doppler measurement; gold; laser velocimetry; micromachining; microsensors; photodiodes; semiconductor lasers; silicon; 3D structure; LDV sensor; bonded photodiode chip; electrode; glass substrate; integrated micro laser doppler velocimeter; laser diode chip; micromachined substrate; micromirror; reflective grating; refractive microlenses; surface-activated bonding method; thin micro laser Doppler velocimetry sensor; through-silicon vias;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors, 2010 IEEE
Conference_Location :
Kona, HI
ISSN :
1930-0395
Print_ISBN :
978-1-4244-8170-5
Electronic_ISBN :
1930-0395
Type :
conf
DOI :
10.1109/ICSENS.2010.5691000
Filename :
5691000
Link To Document :
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