Title :
Electrostatic discharge (ESD) and technology Scaling: The future of ESD protection in advanced technology
Author :
Voldman, Steven H.
Author_Institution :
Vermont, USA
Abstract :
In this paper, electrostatic discharge (ESD) protection in advanced technologies is discussed. The dilemma of ESD protection in advanced technologies and whether we will maintain the need, and desire to provide ESD protection in the future will be reviewed. This issue will influence the direction of the field of ESD protection and the ESD Technology Roadmap. The paper will also focus on what will be the ESD devices used in future 45 nm and 32 nm technologies. What will be the customer expectation, and what will be the ability to continue to achieve these objectives in the future?
Keywords :
customer satisfaction; electrostatic discharge; scaling phenomena; ESD devices; ESD protection; ESD technology roadmap; customer expectation; electrostatic discharge; size 32 nm; size 45 nm; technology scaling; Circuit synthesis; Councils; Electronics industry; Electrostatic discharge; Protection; Robustness; Semiconductor device manufacture; Semiconductor process modeling; Space technology; Technological innovation;
Conference_Titel :
Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-2185-5
Electronic_ISBN :
978-1-4244-2186-2
DOI :
10.1109/ICSICT.2008.4734537
