Abstract :
The following topics are dealt with: SRAM manufacturability; mixed signal and power control circuits; analog design for reliability; lithography; power aware memory design; power distribution, placement and routing; aging analysis and mitigation; system-level NoC, SoC and ASIC design and; fault tolerant design.
Keywords :
SRAM chips; ageing; analogue integrated circuits; fault tolerance; integrated circuit reliability; lithography; mixed analogue-digital integrated circuits; network routing; network-on-chip; ASIC design; SRAM manufacturability; aging analysis; aging mitigation; analog design; fault tolerant design; lithography; mixed signal circuits; network placement; network routing; power aware memory design; power control circuits; power distribution; reliability; system-level network-on-chip design; system-on-chip design;
Conference_Titel :
Quality Electronic Design (ISQED), 2010 11th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-6454-8
DOI :
10.1109/ISQED.2010.5450431
