• DocumentCode
    2143408
  • Title

    Lead telluride-based far-infrared photodetectors as an alternative to doped Si and Ge

  • Author

    Khokhlov, D. ; Dolzhenko, D. ; Ivanchik, I. ; Kristovskiy, K.

  • Author_Institution
    Dept. of Phys., Moscow State Univ., Russia
  • Volume
    6
  • fYear
    2002
  • fDate
    24-28 June 2002
  • Firstpage
    3677
  • Abstract
    Doping of the lead telluride and related alloys with the group III impurities results in appearance of unique physical features of the material, such as persistent photoresponse, enhanced responsive quantum efficiency (up to 100 photoelectrons/incident photon), radiation hardness and many others. We review physical principles of operation of the photodetecting devices based on the group III-doped IV-VI including possibilities of fast quenching of the persistent photoresponse, construction of a focal-plane array, new readout technique, and others. Comparison of performance of the state of the art Ge(Ga) and Si(Sb) photodetectors with their lead telluride-based analogs shows that the responsivity of PbSnTe(In) photodetectors is by several orders of magnitude higher. High photoresponse is detected at the wavelength 116 micrometers in PbSnTe(In), and it is possible that the photoconductivity spectrum covers all the submillimeter wavelength range.
  • Keywords
    IV-VI semiconductors; focal planes; indium; infrared detectors; lead compounds; narrow band gap semiconductors; photodetectors; IV-VI; Pb0.75Sn0.25Te(In); Pb0.75Sn0.25Te:In; Pb1-xSnxTe:In; PbSnTe(In) photodetectors; focal-plane array; group III impurities; lead telluride-based far-infrared photodetectors; photoresponse; quantum efficiency; quenching; radiation hardness; readout technique; submillimeter wavelength; Conducting materials; Doping; Germanium; Lead compounds; Photoconductivity; Photodetectors; Semiconductor impurities; Semiconductor materials; Temperature; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 2002. IGARSS '02. 2002 IEEE International
  • Print_ISBN
    0-7803-7536-X
  • Type

    conf

  • DOI
    10.1109/IGARSS.2002.1027288
  • Filename
    1027288