Title :
Mid-infrared thermomechanical sensitivity of microcantilevers for application to infrared spectroscopy
Author :
Kwon, Beomjin ; King, William P. ; Schulmerich, Matthew ; Bhargava, Rohit
Author_Institution :
Dept. of Mech. Sci. & Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
Abstract :
We report the use of bimaterial microcantilever sensors for sensing narrow-band infrared (IR) radiation generated by a monochromator and its application to IR spectroscopy of polymer films. We selected microcantilever sensors of either silicon or silicon nitride and having a thin metal film coating. To assess the IR measurement capability of these cantilevers, the IR sensitivity to noise ratio (SNR), was measured in the mid-IR fingerprint spectral region (5-10 μm or 1000 2000 cm-1). The measured SNR was in the range of 8 90. We further demonstrated the utility of these sensors by using them to collect an IR absorbance spectrum of 1 μm thick polycarbonate film. The characteristic IR peaks for this film could be seen, and compare well with conventional Fourier Transform IR (FT-IR) data. The spectral resolution of the cantilever sensors determined to be in the range 32 64 cm-1.
Keywords :
Fourier transforms; cantilevers; infrared spectroscopy; temperature sensors; Fourier transform IR; cantilever sensors; infrared spectroscopy; microcantilevers; mid-infrared thermomechanical sensitivity; narrow-band infrared radiation; thin metal film coating;
Conference_Titel :
Sensors, 2010 IEEE
Conference_Location :
Kona, HI
Print_ISBN :
978-1-4244-8170-5
Electronic_ISBN :
1930-0395
DOI :
10.1109/ICSENS.2010.5691004