DocumentCode :
2143516
Title :
First-principles study of Schottky barrier formation of a semiconducting carbon nanotube-metal contact
Author :
He, Yu ; Zhang, Ming ; Zhang, Jinyu ; Wang, Van ; Yu, Zhiping
Author_Institution :
Inst. of Microelectron., Tsinghua Univ., Beijing, China
fYear :
2008
fDate :
20-23 Oct. 2008
Firstpage :
381
Lastpage :
384
Abstract :
Recent experiment shows that scandium (Sc) can make a good performance contact with carbon nanotube (CNT) to fabricate n-type field effect transistor (n-FET). In this paper, we study the Schottky barrier (SB) of scandium (Sc) and palladium (Pd) with a (8,0) single-wall CNT (SWCNT) using first-principles calculation. We find that the p-type SB height (SBH) of the Pd-CNT contact is about 0.34 eV which is in good agreement with experimental value. For the Sc-CNT contact, an n-type contact is formed and the SBH is about 0.15 eV. Our calculation demonstrates that, by contacting CNT with Pd and Sc, p-FET and n-FET can be fabricated, respectively.
Keywords :
Schottky barriers; ab initio calculations; carbon nanotubes; field effect transistors; palladium; scandium; semiconductor nanotubes; semiconductor-metal boundaries; C-Pd; C-Sc; Schottky barrier formation; dipole effect; first-principles calculation; n-type contact; n-type field effect transistor; p-type Schottky barrier height; semiconducting carbon nanotube-metal contact; Carbon nanotubes; Electrodes; Electrons; Energy states; FETs; Helium; Microelectronics; Palladium; Schottky barriers; Semiconductivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-2185-5
Electronic_ISBN :
978-1-4244-2186-2
Type :
conf
DOI :
10.1109/ICSICT.2008.4734544
Filename :
4734544
Link To Document :
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