Title :
Thermal resistance analysis of high power LEDs with multi-chip package
Author :
Kim, Lan ; Hwang, Woong Joon ; Shin, Moo Whan
Author_Institution :
Dept. of Mater. Sci. & Eng., Myong Ji Univ., Kyunggi
Abstract :
Thermal transient measurements of high power GaN-based LEDs with multi-chip designs are presented and discussed. Once transient cooling curve was obtained, the structure function theory was applied to determine the thermal resistance of packages. The measured total thermal resistances from junction to ambient were 19.87 K/W, 10.78 K/W, 6.77 K/W for the one-chip, two-chip and four-chip package, respectively. The contribution of each component to the total thermal resistance of the package can be calculated from the cumulative structure function and differential structure function. The total thermal resistance of multi-chip package is found to decrease with the number of chips due to parallel heat dissipation. Very useful thermal design rule for high power multi-chip LED package is analogized from the experiments. It was found that the effect of the number of chips in a package on the thermal resistance depends on the ratio of partial thermal resistance of chip and that of slug. Thermal resistance for full color multi chip LEDs, where each chip is driven independently, was measured as well and the implication was discussed
Keywords :
III-V semiconductors; cooling; gallium compounds; light emitting diodes; multichip modules; thermal analysis; thermal resistance; wide band gap semiconductors; GaN; full color multichip LED; light emitting diodes; multichip package; parallel heat dissipation; thermal resistance analysis; thermal transient measurements; transient cooling curve; Electrical resistance measurement; Electronic packaging thermal management; Equations; Light emitting diodes; Materials science and technology; Power generation; Semiconductor device measurement; Spontaneous emission; Temperature; Thermal resistance;
Conference_Titel :
Electronic Components and Technology Conference, 2006. Proceedings. 56th
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-0152-6
DOI :
10.1109/ECTC.2006.1645787