DocumentCode :
2143661
Title :
n-Strong-Direct-Product Formal Context
Author :
Li, Mei-Zheng ; Mi, Ju-Sheng
Author_Institution :
Coll. of Math. & Inf. Sci., Hebei Normal Univ., Shijiazhuang, China
fYear :
2010
fDate :
14-16 Aug. 2010
Firstpage :
286
Lastpage :
291
Abstract :
This paper constructs a new formal context called n-Strong-Direct-Product formal context (n-SDPFC, for short) by the strong direct product of n formal contexts, and then discusses the connection between the n-SDPFC and the n original contexts from four aspects: concept lattice, implications between attributes, irreducible elements and attribute characteristics. It is proved that the projection of every formal concept of a n-SDPFC on the i-th original formal context is also a concept of the corresponding original formal context, and under some given conditions, the product of n formal concepts of the n corresponding original formal contexts is a concept of the n-SDPFC. An implications between attributes of an n-SDPFC can be obtained if we know all of the implications between attributes in the original formal contexts, since it can be formed component-wise, and vice verse. A judgement theorem for irreducible elements in the concept lattice of an n-SDPFC is obtained, which is based on the irreducible elements in the n original concept lattices. Then we propose a method for the determination of the attribute characteristics in an n-SPDFC, which is based on the attribute characteristics of the original formal contexts. And this method makes it more easier to find out all of the attribute characteristics in an n-SDPFC.
Keywords :
data analysis; ontologies (artificial intelligence); attribute characteristic; concept lattice; irreducible element; n-SDPFC; n-strong-direct-product formal context; Bismuth; Conferences; Context; Knowledge representation; Lattices; Manganese; attribute characteristics; concept lattices; formal contexts; implications between attributes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Granular Computing (GrC), 2010 IEEE International Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-7964-1
Type :
conf
DOI :
10.1109/GrC.2010.108
Filename :
5575988
Link To Document :
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