Title :
Validation of inverse eigenvalue technique for characterisation of coupled micro/nano resonators
Author :
Choubey, Bhaskar ; Ward, Mike ; Anthony, Carl ; Turnbull, Ross ; Collins, Steve
Author_Institution :
Sch. of Eng., Univ. of Glasgow, Glasgow, UK
Abstract :
Coupling between micro/nanomechanical resonators has been suggested as a means of monitoring the responses of several resonant sensors. In this paper a method is described to determine the system matrix for a linear chain of resonators based upon an inverse eigenvalue analysis. This method relies upon the ability to induce a temporary change to one of the terminal resonators, which is made possible by electrostatic softening. The proposed method has been validated by showing that a system matrix obtained using the method can accurately predict both the eigenvalues and the eigenvectors of the associated set of coupled resonators.
Keywords :
eigenvalues and eigenfunctions; microcavities; micromechanical resonators; microsensors; nanosensors; coupled micro/nano resonators; electrostatic softening; inverse eigenvalue technique; resonant sensors; system matrix; terminal resonator;
Conference_Titel :
Sensors, 2010 IEEE
Conference_Location :
Kona, HI
Print_ISBN :
978-1-4244-8170-5
Electronic_ISBN :
1930-0395
DOI :
10.1109/ICSENS.2010.5691015