DocumentCode :
2143700
Title :
Variation-aware speed binning of multi-core processors
Author :
Sartori, John ; Pant, Aashish ; Kumar, Rakesh ; Gupta, Puneet
Author_Institution :
ECE Dept., Univ. of Illinois at Urbana Champaign, IL, USA
fYear :
2010
fDate :
22-24 March 2010
Firstpage :
307
Lastpage :
314
Abstract :
Number of cores per multi-core processor die, as well as variation between the maximum operating frequency of individual cores, is rapidly increasing. This makes performance binning of multi-core processors a non-trivial task. In this paper, we study, for the first time, multi-core binning metrics and strategies to evaluate them efficiently. We discuss two multi-core binning metrics with high correlation to processor throughput for different types of workloads and different process variation scenarios. More importantly, we demonstrate the importance of leveraging variation model data in the binning process to significantly reduce the binning overhead with a negligible loss in binning quality. For example, we demonstrate that the performance binning overhead of a 64-core processor can be decreased by 51% and 36% using the proposed variation-aware core clustering and curve fitting strategies respectively. Experiments were performed using a manufacturing variation model based on real 65 nm silicon data.
Keywords :
curve fitting; multiprocessing systems; performance evaluation; curve fitting strategies; multicore binning metrics; multicore processors; processor throughput; variation aware core clustering; variation aware speed binning; Curve fitting; Frequency; Manufacturing processes; Multicore processing; Pricing; Process design; Silicon; Testing; Throughput; Virtual manufacturing; Binning; Multi-core; Performance; Process Variations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ISQED), 2010 11th International Symposium on
Conference_Location :
San Jose, CA
ISSN :
1948-3287
Print_ISBN :
978-1-4244-6454-8
Type :
conf
DOI :
10.1109/ISQED.2010.5450442
Filename :
5450442
Link To Document :
بازگشت