Title :
Modeling issues for full-wave numerical EMI simulation
Author :
Cracraft, Michael A. ; Ye, Xiaoning ; Wang, Chen ; Chandra, Sunitha ; Drewniak, James L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Missouri Univ., Rolla, MO, USA
Abstract :
In electromagnetic modeling, agreement between modeling and measurements is a common goal. There are questions that define every model. What is to be modeled? How is it going to be modeled? At what scale is it to be modeled? Through sample results and discussion, this paper addresses some general and some specific elements of model veracity. Through determination, numerical models can certainly be pushed to match any measured results. However, in the end the question that this paper addresses is not necessarily "How good can this model be?" as it is "Is this model good enough?".
Keywords :
electromagnetic compatibility; electromagnetic interference; modelling; numerical analysis; simulation; electromagnetic modeling; full-wave EMI simulation; measurement agreement; model veracity; modeling agreement; numerical models; numerical simulation; Computational modeling; Current measurement; Electromagnetic interference; Electromagnetic measurements; Electromagnetic modeling; Finite difference methods; Numerical models; Numerical simulation; Probes; Time domain analysis;
Conference_Titel :
Electromagnetic Compatibility, 2003 IEEE International Symposium on
Print_ISBN :
0-7803-7835-0
DOI :
10.1109/ISEMC.2003.1236617