Title :
Influence of high energy electrons and protons on secondary electron emission of cover glasses for space solar cells
Author :
Kawakita, S. ; Imaizumi, M. ; Takahashi, M. ; Matsuda, S. ; Michizono, S. ; Saito, Y.
Author_Institution :
Nat. Space Dev. Agency of Japan, Ibaraki, Japan
Abstract :
We measured the secondary electron emission (SEE) of cover glasses for space solar cells by beam blanking scanning electron microscopy (BBSEM) with a Faraday cup. The SEE yield of the cover glass is very important for analyzing the charge profile of the satellite. We observed the SEE of a cover glass coated with ZrO2. This cover glass was chosen for the National Space Development Agency of Japan´s (NASDA´s) Engineering Test Satellite-8 (ETS-8), which is to be launched in 2004. We found the maximum SEE yield of the cover glass to be about 3 for a 1 keV electron beam and that SEE yield depends on the coating material on cover glasses. We investigated the influence of high-energy electrons and protons around satellites on the SEE of a cover glass. As a result, we found that the SEE of a cover glass irradiated with high-energy electrons and protons decreased. This indicates that the differential voltage degreasing with increasing satellite operation.
Keywords :
electron beam effects; glass; proton effects; scanning electron microscopy; secondary electron emission; solar cells; space vehicle power plants; zirconium compounds; 1 keV; Engineering Test Satellite-8; Faraday cup; Japan; National Space Development Agency; ZrO2; ZrO2 coated cover glasses; beam blanking scanning electron microscopy; electron beam; high energy electrons; high energy protons; secondary electron emission; solar cell cover glasses; space solar cells; Blanking; Electron beams; Electron emission; Extraterrestrial measurements; Glass; Photovoltaic cells; Protons; Satellites; Scanning electron microscopy; Testing;
Conference_Titel :
Discharges and Electrical Insulation in Vacuum, 2002. 20th International Symposium on
Print_ISBN :
0-7803-7394-4
DOI :
10.1109/ISDEIV.2002.1027315