• DocumentCode
    2144034
  • Title

    A study of nanoparticles in SnAg-based lead free solders for intermetallic compounds and drop test performance

  • Author

    Amagai, Masazumi

  • Author_Institution
    Tsukuba Technol. Center, Texas Instruments, Tsukuba
  • fYear
    0
  • fDate
    0-0 0
  • Abstract
    Co, Ni, Pt, Al, P, Cu, Zn, Ge, Ag, In, Sb or Au including in Sn-Ag based lead free solders were evaluated to study if these nanoparticles can reduce the growth of intermetallic compounds after 4 time reflow processes and thermal aging. Also, these nanoparticles were studied if they can reduce the frequency of occurrence of intermetallic compound fractures in high impact pull tests. In addition to intermetallic compound analyses, these nanoparticle effects on solder ball hardness were studied if nanoparticles affects solder hardness and displacement in drop tests. Finally, these nanoparticle effects on drop test performance were studied. This study found that Co, Ni and Pt were very effective for the growth of intermetallic compounds and drop test performance compared to Cu, Ag, Au, Zn, Al, In, P, Ge and Sb
  • Keywords
    ageing; materials testing; nanostructured materials; reflow soldering; silver alloys; solders; tin alloys; SnAg; drop test; intermetallic compound fractures; intermetallic compounds growth; lead free solders; nanoparticles; pull tests; reflow processes; solder ball hardness; thermal aging; Aging; Cellular phones; Electronic equipment testing; Environmentally friendly manufacturing techniques; Frequency; Gold; Intermetallic; Lead; System testing; Zinc;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2006. Proceedings. 56th
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    1-4244-0152-6
  • Type

    conf

  • DOI
    10.1109/ECTC.2006.1645802
  • Filename
    1645802