DocumentCode
2144044
Title
Nonparametric bootstrap estimation of confidence interval in base station test
Author
Dalin ma ; Yougang Gao ; Shi, Dan ; Shen, Yuanmao ; Zhou, Yaozhong ; Yang, Qinghai
Author_Institution
Beijing Univ. of Posts & Telecommun., Beijing, China
fYear
2009
fDate
16-20 Sept. 2009
Firstpage
390
Lastpage
394
Abstract
In most test analysis, we always want to construct a parameter model, and then through sample statistics and model parameters, we can get the properties, or characteristics of what we concern about. Confidence intervals can give an estimate of the range within which the true value of the statistic lies. And a narrow confidence interval indicates the low variability of the statistic, which can give a strong support for the conclusion made from the statistical analysis. In base station test, we can barely construct an accurate parameter model, because the measured value varies with many factors. Without theoretical formulas, we can not get accurate assessment of the measured value. The Efron bootstrap statistical analysis can just solve this problem. In this article, we introduce several nonparametric bootstrap methods in assessing the accuracy of sample statistic, and the validations of these methods are performed with both Measured data and simulation data. We have found that all of those methods give an accurate prediction of the 90 percent confidence interval for the mean. And they can still work even under small data sets.
Keywords
statistical analysis; Efron bootstrap statistical analysis; base station test; confidence interval; nonparametric bootstrap estimation; Base stations; Medical tests; Power engineering computing; Signal processing; Software engineering; Statistical analysis; Statistical distributions; Statistics; Telecommunication computing; Testing; Nonparametric bootstrap; base station test; confidence intervals; mean;
fLanguage
English
Publisher
ieee
Conference_Titel
Environmental Electromagnetics, 2009. CEEM 2009. 5th Asia-Pacific Conference on
Conference_Location
Xian
Print_ISBN
978-1-4244-4344-4
Type
conf
DOI
10.1109/CEEM.2009.5303672
Filename
5303672
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