Title :
Accurate QBF-based test pattern generation in presence of unknown values
Author :
Hillebrecht, Stefan ; Kochte, Michael A. ; Erb, Dominik ; Wunderlich, Hans-Joachim ; Becker, Bernd
Author_Institution :
University of Freiburg, Georges-Köhler-Allee 051, 79110, Germany
Abstract :
Unknown (X) values may emerge during the design process as well as during system operation and test application. Sources of X-values are for example black boxes, clock-domain boundaries, analog-to-digital converters, or uncontrolled or uninitialized sequential elements.
Keywords :
Automatic test pattern generation; Circuit faults; Cognition; Computational modeling; Encoding; Integrated circuit modeling; Logic gates; ATPG; QBF; Unknown values; test generation;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
Conference_Location :
Grenoble, France
Print_ISBN :
978-1-4673-5071-6
DOI :
10.7873/DATE.2013.098
