DocumentCode :
2144110
Title :
Effect of Ni on the formation of Cu/sub 6/Sn/sub 5/ and Cu/sub 3/Sn intermetallics
Author :
Yu, Hao ; Vuorinen, Vesa ; Kivilahti, Jorma
Author_Institution :
Lab. of Electron. Production Technol., Helsinki Univ. of Technol., Espoo
fYear :
0
fDate :
0-0 0
Abstract :
In this paper, the effect of Ni on the formation of Cu6Sn5 and Cu3Sn intermetallics between tin and (Cu,Ni)-substrates has been studied by making use of the thermodynamic assessment of the Sn-Cu-Ni system. The driving forces for the diffusions of the elements in the intermetallic layers were calculated as functions of Ni-content. Assuming constant mobilities of elements, the results showed that all the diffusion fluxes in the (Cu,Ni)6Sn5 layer are increased with increasing dissolved Ni, while the dominant fluxes in the (Cu,Ni)3Sn layer decrease. Therefore it is evident that Ni dissolution retards the growth of (Cu,Ni)3Sn. When Ni-content of the substrate is high enough, (Cu,Ni)6Sn5 should be dominant in the reaction zones and the (Cu,Ni)3Sn layer would disappear gradually. The shrinkage of (Cu,Ni)3Sn is associated with larger difference between Sn and Cu fluxes in (Cu,Ni)3Sn and therefore more extensive "Kirkendall void" formation. In addition, the calculated driving forces also suggest that the growth rate of (Cu,Ni) 6Sn5 should further increase after the disappearance of (Cu,Ni)3Sn resulting in an unusually thick (Cu,Ni)6Sn5 layer. The results of thermodynamic calculations supplemented with diffusion kinetic considerations are in good agreements with recent experimental observations
Keywords :
copper alloys; diffusion; nickel alloys; solders; thermodynamics; tin alloys; voids (solid); CuNiSn; Kirkendall void formation; diffusion fluxes; diffusion kinetic; driving forces; element diffusions; intermetallics formation; thermodynamic assessment; thermodynamic calculations; Alloying; Copper; Environmentally friendly manufacturing techniques; Intermetallic; Kinetic theory; Lead; Nickel alloys; Production systems; Thermodynamics; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2006. Proceedings. 56th
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
1-4244-0152-6
Type :
conf
DOI :
10.1109/ECTC.2006.1645805
Filename :
1645805
Link To Document :
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