DocumentCode
2144122
Title
Dynamic-Adaptive Field Induced Charged Device Model (FICDM) compact tester model
Author
Weyl, Thorsten ; Clarke, Dave ; Rinne, Karl
Author_Institution
Raheen Bus. Park, Limerick, Ireland
fYear
2008
fDate
20-23 Oct. 2008
Firstpage
444
Lastpage
447
Abstract
This paper introduces a compact FICDM tester model that includes all prominent tester parasitics and discharge arc behaviours. Geometry variations between different Devices Under Test (DUTs) and associated changes in tester capacitances are accounted for. The variation of ground plane capacitances during the approach of the pogo pin towards the DUT and prior to discharge are also modeled. The tester model was verified across an extensive range of test voltages and DUT capacitances.
Keywords
arcs (electric); capacitance; electron device testing; charged device model; compact tester model; devices under test; discharge arc; dynamic-adaptive field; ground plane capacitances; tester parasitics; Calibration; Capacitance measurement; Circuit testing; Dielectric measurements; Geometry; Parasitic capacitance; Stress; System testing; Thickness measurement; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-2185-5
Electronic_ISBN
978-1-4244-2186-2
Type
conf
DOI
10.1109/ICSICT.2008.4734570
Filename
4734570
Link To Document