Title :
Impact of gate misalignment on the performance of dopant-segregated Schottky Barrier MOSFETs
Author :
Zeng, Lang ; Xiao Yan Liu ; Du, Gang ; Kang, Jin Feng ; Han, Ru Qi
Author_Institution :
Key Lab. of Microelectron. Devices & Circuits, Peking Univ., Peking, China
Abstract :
The impact of gate misalignment on the performance of dopant-segregated Schottky Barrier MOSFET (DS SBTs) and on the carrier transport is investigated by Monte Carlo method. The simulation results show that gate misalignment with dopant-segregated structure (DSS) has less significant impact on drain current than that without DSS. The influence of gate misalignment with DSS becomes notable only when drain voltage is high enough, while gate misalignment without DSS affects drain current always no matter how much drain voltage is. For carrier transport, our results demonstrate that maximal velocity at source side of DS SBTs without gate misalignment shows saturation, while saturation doesn¿t exist in DS SBTs with gate misalignment.
Keywords :
MOSFET; Monte Carlo methods; Schottky barriers; Schottky gate field effect transistors; semiconductor doping; transport processes; Monte Carlo method; SOI UTB dopant-segregated SBT; carrier transport; dopant-segregated Schottky Barrier MOSFET; dopant-segregated structure; gate misalignment; CMOS process; Circuit simulation; Decision support systems; Fabrication; Laboratories; MOSFETs; Microelectronics; Schottky barriers; Silicides; Voltage;
Conference_Titel :
Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-2185-5
Electronic_ISBN :
978-1-4244-2186-2
DOI :
10.1109/ICSICT.2008.4734574