• DocumentCode
    2144199
  • Title

    Impact of gate misalignment on the performance of dopant-segregated Schottky Barrier MOSFETs

  • Author

    Zeng, Lang ; Xiao Yan Liu ; Du, Gang ; Kang, Jin Feng ; Han, Ru Qi

  • Author_Institution
    Key Lab. of Microelectron. Devices & Circuits, Peking Univ., Peking, China
  • fYear
    2008
  • fDate
    20-23 Oct. 2008
  • Firstpage
    504
  • Lastpage
    507
  • Abstract
    The impact of gate misalignment on the performance of dopant-segregated Schottky Barrier MOSFET (DS SBTs) and on the carrier transport is investigated by Monte Carlo method. The simulation results show that gate misalignment with dopant-segregated structure (DSS) has less significant impact on drain current than that without DSS. The influence of gate misalignment with DSS becomes notable only when drain voltage is high enough, while gate misalignment without DSS affects drain current always no matter how much drain voltage is. For carrier transport, our results demonstrate that maximal velocity at source side of DS SBTs without gate misalignment shows saturation, while saturation doesn¿t exist in DS SBTs with gate misalignment.
  • Keywords
    MOSFET; Monte Carlo methods; Schottky barriers; Schottky gate field effect transistors; semiconductor doping; transport processes; Monte Carlo method; SOI UTB dopant-segregated SBT; carrier transport; dopant-segregated Schottky Barrier MOSFET; dopant-segregated structure; gate misalignment; CMOS process; Circuit simulation; Decision support systems; Fabrication; Laboratories; MOSFETs; Microelectronics; Schottky barriers; Silicides; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-2185-5
  • Electronic_ISBN
    978-1-4244-2186-2
  • Type

    conf

  • DOI
    10.1109/ICSICT.2008.4734574
  • Filename
    4734574