DocumentCode
2144199
Title
Impact of gate misalignment on the performance of dopant-segregated Schottky Barrier MOSFETs
Author
Zeng, Lang ; Xiao Yan Liu ; Du, Gang ; Kang, Jin Feng ; Han, Ru Qi
Author_Institution
Key Lab. of Microelectron. Devices & Circuits, Peking Univ., Peking, China
fYear
2008
fDate
20-23 Oct. 2008
Firstpage
504
Lastpage
507
Abstract
The impact of gate misalignment on the performance of dopant-segregated Schottky Barrier MOSFET (DS SBTs) and on the carrier transport is investigated by Monte Carlo method. The simulation results show that gate misalignment with dopant-segregated structure (DSS) has less significant impact on drain current than that without DSS. The influence of gate misalignment with DSS becomes notable only when drain voltage is high enough, while gate misalignment without DSS affects drain current always no matter how much drain voltage is. For carrier transport, our results demonstrate that maximal velocity at source side of DS SBTs without gate misalignment shows saturation, while saturation doesn¿t exist in DS SBTs with gate misalignment.
Keywords
MOSFET; Monte Carlo methods; Schottky barriers; Schottky gate field effect transistors; semiconductor doping; transport processes; Monte Carlo method; SOI UTB dopant-segregated SBT; carrier transport; dopant-segregated Schottky Barrier MOSFET; dopant-segregated structure; gate misalignment; CMOS process; Circuit simulation; Decision support systems; Fabrication; Laboratories; MOSFETs; Microelectronics; Schottky barriers; Silicides; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-2185-5
Electronic_ISBN
978-1-4244-2186-2
Type
conf
DOI
10.1109/ICSICT.2008.4734574
Filename
4734574
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