DocumentCode :
2144258
Title :
A MEMS-based compliant interconnect for ultra-fine-pitch wafer level packaging
Author :
Liao, E.B. ; Tay, A.A.O. ; Ang, S.S.T. ; Feng, H.H. ; Nagarajan, R. ; Kripesh, V. ; Kumar, R. ; Iyer, M.K.
Author_Institution :
Inst. of Microelectron., Singapore
fYear :
0
fDate :
0-0 0
Abstract :
A novel compliant flip-chip interconnect in the form of a planar microspring is presented in this paper. Different spring geometries are evaluated and compared in terms of compliances and electrical parasitics. It is shown that the J-shape spring design gives a better balanced performance. Further numerical studies reveal the geometric dependence of the compliances of J-shape spring interconnects, and also the influence of the sacrificial material upon the electrical performance of the interconnects. The wafer-level process flow for fabrication of the planar microspring interconnects is described and discussed. Prototype interconnects are fabricated by combining planar technology and 3D surface micromachining technology
Keywords :
fine-pitch technology; flip-chip devices; integrated circuit bonding; integrated circuit interconnections; integrated circuit packaging; micromechanical devices; 3D surface micromachining technology; J-shape spring interconnects; MEMS-based compliant interconnect; compliant flip-chip interconnect; electrical performance; planar microspring interconnects; ultra-fine-pitch packaging; wafer level packaging; wafer-level process flow; Fabrication; Geometry; Microelectronics; Micromachining; Ocean temperature; Organic materials; Prototypes; Sea surface; Springs; Wafer scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2006. Proceedings. 56th
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
1-4244-0152-6
Type :
conf
DOI :
10.1109/ECTC.2006.1645812
Filename :
1645812
Link To Document :
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