Global scaling inductor models with temperature effect

Author

He, Danmy ; Cheng, Jenhao ; Chen, Leo

Author_Institution

Logic Technol. Dev. Center, SMIC, Shanghai, China

fYear

2008

fDate

20-23 Oct. 2008

Firstpage

520

Lastpage

522

Abstract

This paper presents global lumped-element circuit models of spiral inductor and differential inductor respectively considering quality factor dependence on temperature. Metal resistance components in equivalent circuits of spiral inductor and differential inductor were adopted to reflect quality factor dependence on temperature in global model. And the global models were shown to give excellent agreement with measured data for inductors of various dimension over temperature range from -40Â°C to 125Â°C, which will facilitate customers to design circuits for worst temperature conditions in real world applications.

Keywords

Q-factor; equivalent circuits; inductors; lumped parameter networks; scaling circuits; differential inductor; equivalent circuits; global scaling inductor models; lumped-element circuit; metal resistance components; quality factor dependence; spiral inductor; temperature -40 degC to 125 degC; temperature effect; Circuits; Electrical resistance measurement; Frequency; Inductors; Parasitic capacitance; Q factor; Spirals; Temperature dependence; Temperature distribution; Temperature measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on

Conference_Location

Beijing

Print_ISBN

978-1-4244-2185-5

Electronic_ISBN

978-1-4244-2186-2

Type

conf

DOI

10.1109/ICSICT.2008.4734578

Filename

4734578