• DocumentCode
    2144442
  • Title

    Space sensitive cache dumping for post-silicon validation

  • Author

    Chandran, Sandeep ; Sarangi, Smruti R. ; Panda, Preeti Ranjan

  • Author_Institution
    Department of Computer Science and Engineering, Indian Institute of Technology Delhi, Hauz Khas, New Delhi - 110016, India
  • fYear
    2013
  • fDate
    18-22 March 2013
  • Firstpage
    497
  • Lastpage
    502
  • Abstract
    The internal state of complex modern processors often needs to be dumped out frequently during post-silicon validation. Since the last level cache (considered L2 in this paper) holds most of the state, the volume of data dumped and the transfer time are dominated by the L2 cache. The limited bandwidth to transfer data off-chip coupled with the large size of L2 cache results in stalling the processor for long durations when dumping the cache contents off-chip. To alleviate this, we propose to transfer only those cache lines that were updated since the previous dump. Since maintaining a bit-vector with a separate bit to track the status of individual cache lines is expensive, we propose 2 methods: (i) where a bit tracks multiple cache lines and (ii) an Interval Table which stores only the starting and ending addresses of continuous runs of updated cache lines. Both methods require significantly lesser space compared to a bit-vector, and allow the designer to choose the amount of space to allocate for this design-for-debug (DFD) feature. The impact of reducing storage space is that some non-updated cache lines are dumped too. We attempt to minimize such overheads. Further, the Interval Table is independent of the cache size which makes it ideal for large caches. Through experimentation, we also determine the break-even point below which a t-lines/bit bit-vector is beneficial compared to an Interval Table.
  • Keywords
    Aerospace electronics; Debugging; Hardware; Program processors; Proposals; Registers; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
  • Conference_Location
    Grenoble, France
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4673-5071-6
  • Type

    conf

  • DOI
    10.7873/DATE.2013.113
  • Filename
    6513559