Title :
Measurement circuits for acquiring SET pulsewidth distribution with sub-FO1-inverter-delay resolution
Author :
Harada, Ryofi ; Mitsuyama, Yukio ; Hashimoto, Masanori ; Onoye, Takao
Author_Institution :
Dept. Inf. Syst. Eng., Osaka Univ., Osaka, Japan
Abstract :
This paper presents two circuits to measure pulse width distribution of single event transients (SETs). We first review requirements for SET measurement in accelerated neutron radiation test and point out problems of previous works, in terms of time resolution, time/area efficiency for obtaining large samples and certainty in absolute values of pulse width. We then devise two measurement circuits and a pulse generator circuit that satisfy all the requirements and attain sub-FO1-inverter-delay resolution, and propose a measurement procedure for assuring the absolute width values. The operation of one of the proposed circuits was confirmed by a preliminary radiation experiment of alpha particles with a fabricated test chip.
Keywords :
integrated circuit testing; pulse generators; radiation hardening (electronics); SET pulse width distribution; accelerated neutron radiation test; alpha particle; measurement circuit; pulse generator circuit; single event transient; sub-FOl-inverter-delay resolution; Area measurement; Circuit testing; Life estimation; Neutrons; Pulse circuits; Pulse generation; Pulse measurements; Semiconductor device measurement; Space vector pulse width modulation; Time measurement;
Conference_Titel :
Quality Electronic Design (ISQED), 2010 11th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-6454-8
DOI :
10.1109/ISQED.2010.5450480