• DocumentCode
    2144572
  • Title

    The application of carbon nanotubes in CMOS integrated circuits

  • Author

    Chan, Philip C.H. ; Yang, Chai ; Zhang, Min ; Fu, Yunyi

  • Author_Institution
    Dept. of Electron. & Comput. Eng., Hong Kong Univ. of Sci. & Technol., Hong Kong, China
  • fYear
    2008
  • fDate
    20-23 Oct. 2008
  • Firstpage
    534
  • Lastpage
    536
  • Abstract
    With the complementary metal-oxide-semiconductor (CMOS) technology approaching its scaling limit, many novel devices and material are being considered to enable further scaling of CMOS. Carbon nanotubes show unique properties and are currently considered as a potential alternative material for nano-CMOS building blocks. Performance of carbon nanotube field effect transistors (CNFET) can be competitive with Si MOSFET in the sub-20 nm regime. With its superior material properties, CNT can also function as quantum wire and a critical material for the integrated circuit interconnection. In this talk, we shall present some of the works we have done on applying carbon nanotubes to the CMOS Integrated Circuits in our research group at the Hong Kong University of Science and Technology.
  • Keywords
    CMOS integrated circuits; MOSFET; carbon nanotubes; elemental semiconductors; integrated circuit interconnections; nanotube devices; semiconductor quantum wires; silicon; C; CMOS integrated circuits; MOSFET; Si; carbon nanotube field effect transistors; carbon nanotubes; complementary metal-oxide-semiconductor technology; integrated circuit interconnection; quantum wire; size 20 nm; CMOS integrated circuits; CMOS technology; CNTFETs; Carbon nanotubes; Inorganic materials; Integrated circuit technology; MOSFET circuits; Material properties; Nanostructured materials; Organic materials;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-2185-5
  • Electronic_ISBN
    978-1-4244-2186-2
  • Type

    conf

  • DOI
    10.1109/ICSICT.2008.4734590
  • Filename
    4734590